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Free Access Review paper Image Algebra for Electron Images p. 159 Peter W. Hawkes DOI: https://doi.org/10.1051/mmm:1995116 PDF (2.308 MB)References
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Free Access Book review: Defect Recognition and Image Processing in Semiconductors and Devices J. Jimenez Institute of Physics Conference Series 135, 1994 p. 249 André Rocher DOI: https://doi.org/10.1051/mmm:0199500602024900 PDF (73.97 KB)
Free Access Book review: Physical Methods for Materials Characterisation P.E.J. Flewitt and R.K. Wild Graduate student series in Material Science and Engineering, Series Ed. B. Cantor, Institute of Physics Publishing (Bristol and Philadelphia, 1994 p. 250 Nathalie Brun DOI: https://doi.org/10.1051/mmm:0199500602025000 PDF (94.08 KB)