Microscopy Microanalysis Microstructures

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Bienvenue au Dernier-né p. I

P.W. Hawkes

DOI: https://doi.org/10.1051/mmm:01995006020R100

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Review paper Image Algebra for Electron Images p. 159

Peter W. Hawkes

DOI: https://doi.org/10.1051/mmm:1995116

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Influence of the Substrate on the Composition of Pd-Doped Tin Oxide Thin Films Studied by EPMA and SNMS p. 179

Alexander Gaskov, Benoit Gautheron, Nicole Valignat and Michel Labeau

DOI: https://doi.org/10.1051/mmm:1995117

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Measurement of Diffusion in Liquids within Porous Solids by X-Ray Microradiography: Determination of Errors and Optimization of Experimental Conditions p. 187

Stephanie E. P. Dowker, Paul Anderson and James C. Elliott

DOI: https://doi.org/10.1051/mmm:1995118

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Quantitative Analysis of Nicalon Fibres in TEM by EDXS and EELS p. 205

Dominique Imhoff, Nathalie Mozdzierz and Monika Backhaus-Ricoult

DOI: https://doi.org/10.1051/mmm:1995119

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HREM Observations of Ion Bombardment-Induced Dislocation Loops in ZnO p. 229

Jean-Jacques Couderc, Jean-Jacques Demai, Guy Vanderschaeve and Alain Peigney

DOI: https://doi.org/10.1051/mmm:1995101

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HRTEM Studies of the Epitaxial Growth of Pd Particles (1-6 nm) on ZnO Micro-Prisms p. 237

Suzanne Giorgio, Claude R. Henry and Claude Chapon

DOI: https://doi.org/10.1051/mmm:1995120

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Book review: Defect Recognition and Image Processing in Semiconductors and Devices J. Jimenez Institute of Physics Conference Series 135, 1994 p. 249

André Rocher

DOI: https://doi.org/10.1051/mmm:0199500602024900

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Book review: Physical Methods for Materials Characterisation P.E.J. Flewitt and R.K. Wild Graduate student series in Material Science and Engineering, Series Ed. B. Cantor, Institute of Physics Publishing (Bristol and Philadelphia, 1994 p. 250

Nathalie Brun

DOI: https://doi.org/10.1051/mmm:0199500602025000

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