Free Access
Issue |
Microsc. Microanal. Microstruct.
Volume 3, Number 2-3, April / June 1992
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Page(s) | 187 - 199 | |
DOI | https://doi.org/10.1051/mmm:0199200302-3018700 |
References of Microsc. Microanal. Microstruct. 3 187-199
- Hillier J. and Baker R.F. , J. Appl. Phys . 15 (1944) 663. [CrossRef]
- Crewe A.V. , Isaacson M. and Johnson D. , Rev. Sci. Instrum. 42(1971) 411. [CrossRef] [PubMed]
- Castaing R. and Henry L. , C.R. Acad. Sci. Paris B255 (1962) 76.
- Senoussi S. , Henry L. and Castaing R. , J. Microsc. 11 (1971) 19.
- Zanchi G. , Perez J.-P. and Sevely J. , Optik 43 (1975) 495.
- Krahl D. , Hermann K.H. and Kunath W. , Proc. 9th Int. EM Congress, J. M. Sturgess Ed. ( Microscopical Society of Canada, Toronto, 1978 ), vol 1, p. 42.
- Rose H. and Pejas W. , Optik 54 (1979) 235.
- Lanio S. , Optik 73 (1986) 99.
- Krivanek O.L. and Swann P.R. , in: Quantitative Microanalysis with High Spatial Resolution, G.W. Lorimer, M.H. Jacobs and P. Doig Eds. ( The Metals Society, London, 1981 ) p. 136.
- Ajika N. , Hashimoto H. , Yamaguchi K. and Endoh H. , Jpn J. Appl. Phys. 24 (1985 ) L41. [CrossRef]
- Shuman H. and Somlyo A.P. , Proc. Nat. Acad. Sci. USA 79 (1982) 106. [CrossRef]
- Krivanek O.L. and Ahn C.C. , Electron Microscopy 1986, T. Imura, S. Maruse and T. Suzuki Eds. (Jap. Soc. Electron Microscopy , Tokyo, Japan, 1986) vol. 1, p. 519.
- Krivanek O.L. , US patent ,# 4 851, 670.
- Krivanek O.L. , Gubbens A.J. and Dellby N. , Microsc. Microanal. Microstruct. 2( 1991) 315. [CrossRef]
- Mooney P.M. et al., Electron Microscopy 1990, L.D. Peachey and D.B. Williams Eds. (San Francisco Press, San Francisco , 1990) vol. 1, p. 104.
- Krivanek O.L. , Ahn C.C. , and Keeney R.B. , Ultramicroscopy 22 (1987) 103. [CrossRef]
- Proceedings of European Workshop on Electron Spectroscopic Imaging and Analysis Techniques, L. Reimer Ed., Ultramicroscopy 32 (1990) 1-89. [CrossRef] [PubMed]
- Leapman R.D. and Hunt J.A. , Microsc. Microanal. Microstruct. 2 (1991) 231. [CrossRef]
- Shuman H. and Kruit P. , Rev. Sci. Instrum. 56 (1985) 231. [CrossRef]
- Hunt J.A. and Williams D.B. , Ultramicroscopy 38 (1991) 47. [CrossRef]
- Leapman R.D. and Hunt J.A. , in: Microscopy, The Key Research Tool (Electron Microscopy Society of America, Woods Hole, MA, USA, 1992) p. 39.
- Craven A.J. and Colliex C. , in: Proc. 35-th EMSA meet, G.W. Bailey Ed. (Claitor's, Baton Rouge, Louisiana, USA, 1977 ) p. 242.
- Krivanek O.L. , Ahn C.C. and Wood G.J. , Ultramicroscopy 33 (1990) 177. [CrossRef]
- Egerton R.F. , Electron Energy Loss Spectroscopy in a Transmission Electron Microscope (Plenum Press, New York, 1986).