Free Access Editorial Editorial p. V Christian Colliex DOI: https://doi.org/10.1051/mmm:0199200302-30R500 PDF (269.4 KB)
Free Access Some early recollections of Raimond Castaing in microprobe analysis p. VII Peter Duncumb DOI: https://doi.org/10.1051/mmm:0199200302-30R700 PDF (230.0 KB)
Free Access Raimond Castaing remembered p. X Robert E. Ogilvie DOI: https://doi.org/10.1051/mmm:0199200302-30R1000 PDF (337.6 KB)
Free Access Reminiscences on encounters with Raimond Castaing p. XII Michael J. Whelan DOI: https://doi.org/10.1051/mmm:0199200302-30R1200 PDF (405.1 KB)References
Free Access Remembrances of Raimond Castaing and his work p. XV David B. Wittry DOI: https://doi.org/10.1051/mmm:0199200302-30R1500 PDF (265.8 KB)
Free Access Microanalysis and on-line computers p. 95 Kurt F. J. Heinrich DOI: https://doi.org/10.1051/mmm:0199200302-309500 PDF (516.4 KB)References
Free Access From direct ion images to ion probe scanning p. 99 Georges Slodzian, Bernard Daigne and François Girard DOI: https://doi.org/10.1051/mmm:0199200302-309900 PDF (2.479 MB)References
Free Access Microscope imaging by time-of-flight secondary ion mass spectrometry p. 119 Bruno W. Schueler DOI: https://doi.org/10.1051/mmm:0199200302-3011900 PDF (2.247 MB)References
Free Access Energy-filtering transmission electron microscopy in materials science p. 141 Ludwig Reimer, Inge Fromm, Christoph Hülk and Reinhold Rennekamp DOI: https://doi.org/10.1051/mmm:0199200302-3014100 PDF (2.641 MB)References
Free Access Elemental mapping using an imaging energy filter: image formation and resolution limits p. 159 Arthur Berger and Helmut Kohl DOI: https://doi.org/10.1051/mmm:0199200302-3015900 PDF (1.354 MB)References
Free Access New possibilities in the observation of nucleic acids by electron spectroscopic imaging p. 175 Etienne Delain, Alain Fourcade, Bernard Révet and Claudie Mory DOI: https://doi.org/10.1051/mmm:0199200302-3017500 PDF (1.889 MB)References
Free Access Design and first applications of a post-column imaging filter p. 187 Ondrej L. Krivanek, Alexander J. Gubbens, Niklas Dellby and Christopher E. Meyer DOI: https://doi.org/10.1051/mmm:0199200302-3018700 PDF (2.082 MB)References
Free Access EXELFS as a structural tool for studies of low Z-elements p. 201 Virginie Serin, Gerald Zanchi and Jean Sévely DOI: https://doi.org/10.1051/mmm:0199200302-3020100 PDF (1.398 MB)References
Free Access p → p-like transitions at the silicon L2,3-edges of silicates p. 213 Paul Lenvig Hansen, Rik Brydson and David W. McComb DOI: https://doi.org/10.1051/mmm:0199200302-3021300 PDF (862.2 KB)References
Free Access The HOLZ lines in Si[111] zone axis patterns p. 221 Gottfried Möllenstedt and Fang Zhou DOI: https://doi.org/10.1051/mmm:0199200302-3022100 PDF (1.379 MB)References
Free Access Incoherence effects in reflection electron microscopy p. 233 Archie Howie, Mary Y. Lanzerotti and Zhong Lin Wang DOI: https://doi.org/10.1051/mmm:0199200302-3023300 PDF (1.639 MB)References
Free Access First attempt towards the direct determination of the Guinier-Preston zones (GP1) copper content in Al-1.7 at % Cu alloy p. 243 Bernard Jouffrey and Miroslav Karlik DOI: https://doi.org/10.1051/mmm:0199200302-3024300 PDF (1.686 MB)References
Free Access Le problème de l'analyse élémentaire quantitative des produits de pulvérisation p. 259 Guy Blaise DOI: https://doi.org/10.1051/mmm:0199200302-3025900 PDF (1.306 MB)References
Free Access An expression for the Auger backscattering factor and the ϕ(0) function at oblique incidences p. 271 Jacques Cazaux DOI: https://doi.org/10.1051/mmm:0199200302-3027100 PDF (1.660 MB)References
Free Access Determination of some C60 electronic properties. Application to the cohesive energy in C60 ionic compounds p. 287 Pierre Joyes and René-Jean Tarento DOI: https://doi.org/10.1051/mmm:0199200302-3028700 PDF (784.1 KB)References
Free Access Electron probe quantitation edited by K.F.J. HEINRICH and D.E. NEWBURY (Plenum Press New York, 1991) p. 295 DOI: https://doi.org/10.1051/mmm:0199200302-3029500 PDF (284.7 KB)
Free Access Transmission electron energy loss spectrometry in materials science edited by M.M. DISKO, C.C. AHN and B. FULTZ (Minerals, Metals and Materials Society, TMS, 1992) p. 296 DOI: https://doi.org/10.1051/mmm:0199200302-3029601 PDF (345.9 KB)
Free Access Microscopy. The key research tool. Compositional imaging. New microscopies A special publication of the Electron Microscopy Society of America, 1992 p. 297 DOI: https://doi.org/10.1051/mmm:0199200302-3029701 PDF (241.8 KB)
