Free Access
Issue
Microsc. Microanal. Microstruct.
Volume 6, Number 5-6, October / December 1995
Page(s) 551 - 558
DOI https://doi.org/10.1051/mmm:1995147
References of Microsc. Microanal. Microstruct. 6 551-558
  • Binnig G., Quate C.F. and Gerber Ch., Phys. Rev. Lett. 56 (1986) 930. [CrossRef] [PubMed]
  • Martin Y., Abraham D.W. and Wickramasinghe H.K., Appl. Phys. Lett. 52 (1988) 1103. [CrossRef]
  • Lüthi R., Haefke H., Meyer K.R., Meyer E., Howald L. and Güntherodt H.J., J. Appl. Phys. 74 (1993) 7461. [CrossRef]
  • Stern J.E., Terris B.D., Mamin H.J. and Rugar D., Appl. Phys. lett. 53 (1988) 2717. [CrossRef]
  • Abraham D.W., Williams C.C., Slinkman J. and Wickramasinghe H.K., J. Vac. Sci. Technol. B 9 (1991) 703. [CrossRef]
  • Sparrow T.G. and Valdrè U., Philos. Mag. 36 (1977) 1517. [CrossRef]
  • Martin Y., Williams C.C. and Wickramasinghe H.K., J. Appl. Phys. 61 (1987) 4723. [CrossRef]
  • Terris B.D., Stern J.E., Rugar D. and Mamin H.J., Phys. Rev. Lett. 63 (1989) 2669. [CrossRef] [PubMed]
  • Sze S., The Physics of Semiconductor Devices (Wiley, New York, 1981).