Free Access News from the "Cercle Français des Microscopies à Champ Proche" (CFMCP) p. I J. Beauvillain, L. Porte and F. Salvan DOI: https://doi.org/10.1051/mmm:01994005010R100 AbstractPDF (87.18 KB)
Free Access Une modélisation de l'influence de la métallisation des objets et de la forme des sondes en SNOM p. 1 Dominique Barchiesi and Daniel Van Labeke DOI: https://doi.org/10.1051/mmm:01994005010100 AbstractPDF (1.117 MB)References
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Free Access Microscope à double détection : STOM-AFM, principe et résultats p. 19 Fadi Baida, Chekib Mered and Daniel Courjon DOI: https://doi.org/10.1051/mmm:019940050101900 AbstractPDF (1.382 MB)References
Free Access Characterization of the metal-semiconductor interface by ballistic electron emission microscopy p. 31 Roland Coratger, François Ajustron and Jacques Beauvillain DOI: https://doi.org/10.1051/mmm:019940050103100 AbstractPDF (1.041 MB)References
Free Access Cross characterization by scanning electron microscopy and atomic force microscopy of Ag islands grown on Si (111) 7×7 p. 41 M. Hanbücken, I. Vianey, F. Palmino and D. Pailharey DOI: https://doi.org/10.1051/mmm:019940050104100 AbstractPDF (689.5 KB)References
Free Access Scanning tunneling microscopy study of a DNA fragment of known size and sequence p. 47 Monique Marilley, Philippe Pasero, Alain Humbert, Samuel Granjeaud, Michel Dayez, Roger Pierrisnard and Bertrand Jordan DOI: https://doi.org/10.1051/mmm:019940050104700 AbstractPDF (1.244 MB)References
Free Access STM studies of Si and C evaporation on Si (111) at RT by laser ablation p. 57 J. Diaz, S. Ferrer and F. Comin DOI: https://doi.org/10.1051/mmm:019940050105700 AbstractPDF (913.0 KB)References
Free Access Analysis by scanning force microscopy of enzyme-containing Langmuir-Blodgett films elaborated by a horizontal lifting method p. 61 Stéphane Alexandre, Nicolas Dubreuil, Catherine Fiol and Jean-Marc Valleton DOI: https://doi.org/10.1051/mmm:019940050106100 AbstractPDF (1.089 MB)References
Free Access Monocouches de billes de latex ou de silice : utilisation pour la calibration et pour le contrôle des pointes en AFM p. 71 M.-C. Boisset and C. Frétigny DOI: https://doi.org/10.1051/mmm:019940050107100 AbstractPDF (996.1 KB)References
